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Join Statistics and Physics into Systemic Early FAILURE ANALYSIS

Traditional quality approaches to modern electronics and hybrids often rely on expensive, unguaranteed phenomenological methods, resulting in high-risk losses and missed opportunities at all stages of a product-project life cycle. The three-step systemic early failure analysis (SEFA) methodology successfully addresses PEF challenges using complementary methods and tools. This session sheds light on a detailed examination of characteristic solder PEF as well as other cross-industry live PEFs. Attendess will review theoretical considerations and practical recommendations that help lead to comprehensive and synergetic improvements.